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[1] Orientation independent growth of uniform ferroelectric Hf0.5Zr0.5O2 thin films on silicon for high-density three-dimensional memory applications
2023-03-22
[2] Intrinsic 90° charged domain wall and its effects on ferroelectric properties
2023-03-22
[3] Robustly stable ferroelectric polarization states enable long-term nonvolatile storage against radiation in HfO2-based ferroelectric field-effect transistors
2023-03-22
[4] Robustly stable intermediate memory states in HfO2-based ferroelectric field-effect transistors
2023-03-22
[5] Flux-closure domains in PbTiO3/SrTiO3 multilayers mediated without tensile strain
2023-03-22
[6] Interface effects induced by a ZrO2 seed layer on the phase stability and orientation of HfO2 ferroelectric thin films: a first-principles study
2023-03-22
[7] Hf0.5Zr0.5O2-based ferroelectric field-effect transistors with HfO2 seed layers for radiation-hard nonvolatile memory applications
2023-03-22
[8] Mechanical manipulation of nano-twinned ferroelectric domain structures for multilevel data storage
2021-03-12

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廖敏

Personal Information:

Name (Simplified Chinese):廖敏
Name (Pinyin):LIAOMIN
E-Mail:mliao@xidian.edu.cn
Education Level:With Certificate of Graduation for Doctorate Study
Gender:Male
Degree:Doctoral Degree in Engineering
Professional Title:Professor
Supervisor of Doctorate CandidatesSupervisor of Doctorate Candidates
graduate teachergraduate teacher